May 26, 2017
Credit: Gordon P. Lee University of Hawaii Physical Electronics Laboratory Honolulu, Hawaii, USA
Subject Matter: Etched-enhanced stacking faults in silicon wafer surface (50x)
Technique: Differential Interference Contrast
seen from Germany
seen from North Macedonia
seen from United States
seen from China
seen from United States
seen from North Macedonia
seen from United States
seen from United States
seen from United States
seen from United States
seen from Netherlands
seen from United States
seen from Brazil
seen from United States
seen from United States
seen from United States
seen from United States
seen from United States
seen from United States
seen from United States
Credit: Gordon P. Lee University of Hawaii Physical Electronics Laboratory Honolulu, Hawaii, USA
Subject Matter: Etched-enhanced stacking faults in silicon wafer surface (50x)
Technique: Differential Interference Contrast
Credit: William Edward Schadel Small Wonder Enterprises Raleigh, North Carolina, USA
Subject Matter: Sulfur and ketone crystals (20x)
Technique: Polarized Light