May 26, 2017
Credit: Gordon P. Lee University of Hawaii Physical Electronics Laboratory Honolulu, Hawaii, USA
Subject Matter: Etched-enhanced stacking faults in silicon wafer surface (50x)
Technique: Differential Interference Contrast
seen from China
seen from Germany
seen from Russia
seen from China
seen from Türkiye
seen from United States
seen from United States
seen from Canada
seen from Sweden
seen from India
seen from China
seen from United Kingdom
seen from France
seen from United States
seen from China
seen from United States
seen from France
seen from United States
seen from China
seen from Thailand
Credit: Gordon P. Lee University of Hawaii Physical Electronics Laboratory Honolulu, Hawaii, USA
Subject Matter: Etched-enhanced stacking faults in silicon wafer surface (50x)
Technique: Differential Interference Contrast
Credit: William Edward Schadel Small Wonder Enterprises Raleigh, North Carolina, USA
Subject Matter: Sulfur and ketone crystals (20x)
Technique: Polarized Light