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All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, lateral force mode (LFM), and measurement of force-distance curves. Optional modes expand the capability of your atomic force microscope. These include: Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force-Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.

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AFMWorkshop instrumentation has an open design, allowing customization of AFMs by users. The company also develops unique alterations and components. Learn More

Additionally, Atomic Force Microscopes fields requests from individual researchers looking for assistance in developing unique alterations and components. We're open to discussing your ideas and working together with you on implementation. Pricing and timelines are dependent on the project.

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Atomic Force Microscopes Continue to Evolve Based on The Changing Requirements of Scientists

The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. Atomic force microscopes continue to evolve and advance as scientists require higher resolution topographic scanning.

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AFMWorkshop’s Atomic Force Microscopes Continue to Evolve Based on The Changing Requirements of Scientists

Light Lever Force Sensor

The light lever force sensor had its origins in the work of precision engineers working on surface profilers. In 1932, Smaltz presented a light lever stylus profile that used film to record the movement of a sharp probe as it scanned across a surface. This technique was first applied to AFM by Amer, an IBM scientist. The light lever force sensor is now the standard in AFM designs.

Vibrating Mode AFM

As with the light lever force sensor, vibrating probe instruments were developed first for surface profilers. It was discovered that by vibrating the probe above a surface as it was scanned, lateral forces on the probe were reduced. Although Binnig and Quate discussed vibrating modes in their pioneering paper, it was a team of IBM scientists led by Kumar Wickramsinghe that first applied vibrating techniques to the AFM.

Feedback Circuits

The first scanning tunneling microscope developed at IBM in Switzerland utilized analog feedback to control the relationship between the probe and surface while measuring an image. This is very similar to the pioneering work of Young at the NBS. Soon after that pioneers such as A. Lewis built scanning probe microscopes with digital feedback. However, because of the limitations of ADC and DAC converters, AFM Workshop uses high-fidelity analog feedback circuits to control the Z position of the probe/sample in its microscopes.

Re-Trace Technology

In a scanning probe microscope, it is often advantageous to store height information while scanning a sample. This stored information can then be used for a following scan to hold the probe at a fixed distance above a sample's surface. This technique was pioneered by University of Texas Professor Alan Bard.

To learn more about our atomic force microscopes, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

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The TT-2 Atomic Force Microscope from AFM Workshop is an affordable tabletop AFM capable of high-resolution scanning with a noise floor under 0.1 nm. With prices starting at $33,980, the TT-2 AFM is a cost-effective option for researchers and scientists in fields of nanotechnology, chemistry, and biology applications.

Atomic Force Microscope Training Programs TT-2 Assembly Workshop

The ultimate in a comprehensive knowledge of Atomic Force Microscope design and function can be gained through AFMWorkshop's TT-2 AFM Assembly Workshop. Participants build their own AFM and participate in numerous workshops on AFM theory, operation, and applications.

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AFMWorkshop: Provides the essential materials for AFM training and education

AFMWorkshop provides the essential materials for AFM training and education. It also offers educational curriculums including labs for students learning the application of atomic force microscopy. To learn, visit our website: https://www.afmworkshop.com/learning-center

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The B AFM from AFM Workshop is a Basic Atomic Force Microscope designed at a low-cost for routine surface scanning and education applications. With prices starting at $19,500, the B AFM is the highest-value atomic force microscope on the market. It is capable of scanning most samples and is ideal for many applications

B AFM - An Atomic Force Microscope for Beginners

The B AFM is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the Basic Atomic Force Microscope stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

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B AFM - An Atomic Force Microscope for Beginners!

Key Features and Benefits of the B AFM

7-Step Scanning Software

The B AFM7-Step Scanning Software is designed for casual AFM users that want to obtain AFM images without requiring expertise. A user-friendly design makes the B AFM ideal for teaching students the basics of AFM theory and operation.

Intuitive Light Lever Design

A unique design of the light lever makes aligning the system a routine procedure for users with limited experience. A removable probe holder makes changing probes quick and easy.

Linearized X, Y, and Z Scanners

Piezoelectric X, Y (50 µm) and Z (17 µm) scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.

Standard AFM Scanning Modes

Scanning modes for the B AFM include vibrating (tapping), non-vibrating (contact), phase, and LFM (Force/Distance). These modes will allow users to scan the most common types of samples.

Acoustic Enclosure

The B AFM is encased in an acoustic cabinet made from ¾” MDF and acoustic foam, creating a vibration isolation environment that will provide high-quality scans on almost any lab bench.

Applications of the B AFM

Education

The B AFM is ideal for educating students on the theory, operation and applications of an atomic force microscope. One of the advantages of the B AFM for education is the open design of the light lever force sensor.

Routine Scanning

Routine scanning of samples that are not challenging to scan is a common application for the B AFM. If a noise floor below 300pM is required, we suggest purchasing the AFM Control software and a vibration table.

All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), as well as force distance. However, you can always expand the capability of your nanoscience instrument even more with optional AFM modes based at your specific needs and requirements.

To learn more about atomic force microscopes, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

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