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AFM Workshop’s Nano-Profiling Atomic Force Microscope Offer the Highest Performance to Price Ratio in The Industry

The NP AFM is a nanoprofiler for the analysis of features such as surface roughness and metrology of technical samples. Primary applications for the Nano-Profiling Atomic Force Microscope include process development and process control of technical samples.

Nano-Profiler AFM Overview

The NP AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP AFM system, and several stage options are available for many types of samples. The Nano-Profiler AFM is primarily used for routine scanning of technical samples such as wafers and disks or for nanotechnology research.

Key Features of The NP AFM

Nano-Profiling AFM

The Nano-Profiling Atomic Force Microscope accommodates industry-standard sized probes and is used for profiling technical samples including wafers and disks in industry applications.

Standard Operating Modes Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Three Sample Stage Options Three sample stage options can accommodate different samples with sizes as large as 200mm X 200mm X 20mm.

Linearized X, Y Piezoelectric Scanner Piezoelectric X and Y scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.

Direct-Drive Tip Approach A linear motion stage is used to move the probe perpendicular to the sample. Probe angle alignment is not required, facilitating a much faster probe approach.

LabVIEW Operation Industry-standard programming environment, functions include setting scanning parameters, probe approach, frequency tuning, and displaying images in real-time. Compatible with older operating systems as well.

Video Microscope The video optical microscope in an NP-2 AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating the probe approach.

NP AFM Capabilities:

Visualization of Surface Features Visualization of surface features can help understand why a process is working or not working. AFM offers extreme contrast on flat samples often encountered in industry wafers and disks for quality control and assurance.

Surface Roughness/Texture Surface roughness measurements at the nanoscale are only possible with an atomic force microscope. With the appropriate vibration isolation enclosure, it is possible to measure surface textures under 0.1 nm.

Step-Height Measurements The NP AFM is a stylus profiler capable of making step height measurements from 0.3 to 500 nanometers. An included video microscope is essential for locating regions of interest for scanning.

Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with a flexible scanning software developed in LabVIEW. These modular AFMs are useful in a variety of research, industry, and educational settings. To learn more about AFMWorkshop and our Atomic Force MicroscopePrice, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

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AFMWorkshop offers multiple AFM courses and atomic force microscopy training opportunities for professionals and students throughout the year. From building your own AFM, to learning advanced techniques and applications, our workshops are intensive, informative, and fun.

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Atomic Force Microscopes can be modified for a number of custom applications in science, research & engineering. AFM is a platform for new and existing instrumentation.

The TT-2 AFM is ideal for instrument builders who want to use an Atomic Force Microscope as a platform for creating new instrumentation (such as a new imaging mode), or who want to use an Atomic Force Microscope in combination with another analytical instrument. TT-2 AFM customers have access to the systems software, mechanical drawings, and schematics. Because the software is written in LabVIEW, it can be easily modified to meet very specific demands.

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Atomic Force Microscopy service, maintenance, support; advanced customization and flexible custom engineering of Atomic Force Microscopes (AFMs) for Original Equipment Manufacturers (OEMs) and all other AFMWorkshop customers.

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Atomic Force Microscopy Studies of Two-Dimensional Materials

Atomic Force Microscopes are ideally suited for creating 3-D images and measurements on 2-D materials. This is because AFMs have extreme contrast on flat samples and can magnify surface heights by factors of millions to billions. Standard reference samples that illustrate the extreme contrast of an AFM are SiC and Si (111). Each of these samples has well characterized surface features that are in the same range as 2-D materials such as graphene.

Besides illustrating the power of an AFM, these types of samples serve as calibration samples for microscopes used for imaging 2-D materials.

Two dimensional materials are currently under development with potential to gain enormous importance in electronics, sensing, optics and other areas. Such materials, despite facile production methods in many cases, can display radically different properties compared to 3D or bulk materials. These new and enhanced properties come about due to nanoscale confinement effects, meaning they are generally accessible only when a material is limited to 1, or at most to a few atomic layers. For this reason, research and development in 2D material and 2D materials-based devices relies crucially on the ability to characterise such materials at the nanoscale, including the observation of atomic steps. AFM is unique in its ability to measure sample heights with resolution in excess of 0.1 nm. This explains why AFM has become a key tool in the arsenal of researchers studying 2D materials.

Discussion of AFM Images of 2-D Materials

Although graphene is a single atom thick sheet, it is not typically found to be perfectly flat. Indeed, some nanometre scale corrugations are commonly observed and may increase the stability of the 2D lattice. Despite its great strength, graphene is also a highly flexible material, and typically takes on the form of the underlying substrate. So, for example, on Si/SiO2 wafers, graphene can exhibit a considerable roughness due to the underlying substrate. Thus, a considerable texture, dependent on the SiO2 structure at the wafer surface, can be seen in the CVD graphene flakes.

For many applications, graphene is grown on one substrate and transferred to another. This can lead to considerable changes in surface coverage. In order to understand data from transferred graphene, it can be useful to measure surface coverage.

Figure 1 shows images of multi-crystalline nickel metal surface coated with CVD graphene. In this sample, the coverage was almost 100% on the nickel surface. After transfer to a silicon wafer, it could be seen that coverage was decreased. During CVD growth of graphene, a number of defects can be introduced, including grain boundaries, as well so-called “wrinkles”. These defects can alter the properties of the graphene layers, and in some cases can be useful, for example, grain –boundaries show increase chemical reactivity, potentially useful in sensing applications. It has been shown that AFM is a highly useful technique to map and even distinguish different defects on graphene.

Imaging of graphene by AFM can be carried out in either contact or vibrating mode using AFMWorkshop instruments. However, it should be noted that the method chosen can change the height measured for the graphene monolayers. In fact, here have been quite a variety of different heights reported from 0.3 to 1.7 nm for single-layer graphene. These differences have been attributed to complex tip-sample interactions, which can depend on the mode used, and nature of substrate and scanning environment. In this case, the flakes were measured using vibrating mode and the height profile in figure 2 shows that the height measured was 1.3 nm. In order to achieve very low noise levels, such as those shown in figure 2, it is important to optimise vibration and acoustic isolation. It is also highly recommended to use a small z height scanner (such as the AFM Workshop 15×15×7 µm scanner, and ensure low gain setting are used. The measurements environment can also affect the results. In some cases, where surfactant or transfer agents contaminate the graphene surface, measuring in a liquid environment can result in a cleaner image.

In addition to imaging applications, AFM can be very useful for directly measuring the unique properties of 2D materials. For example, methods such as conducting AFM, electrostatic force microscopy (EFM), and Kelvin probe microscopy have proven useful in measuring the electrical properties of 2D materials such as graphene, graphene oxide, or MoS2. A unique advantage of using atomic force microscopes for these kinds of experiments, in addition to the measurement of very small features, is the ability to directly compare the electrical properties to the material structure in two dimensional materials. Similarly, magnetic force microscopy (MFM) can be useful to measure magnetic fields associated with 2D magnetic materials such as graphene, MoS2, etc. Finally, AFM can be extremely useful to measure mechanical properties of 2D materials. For such experiments, a substrate with many holes can be coated with the material to be investigated, and the mechanical resistance probed directly by measurement of force-distance curves.

Overall, AFM is a vital tool for nanotechnologists who require characterisation and development of 2D materials and devices, combining ultra-high-resolution size characterisation with the ability to characterise a number of other key properties of these fascinating materials.

To learn more about atomic force microscopes, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

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Atomic Force Microscopes manufactured by AFMWorkshop are a cost-effective option for high-resolution scanning of nanostructures and visualization of nanoparticles, polymers, and biological samples. Modes include liquid AFM, conductive AFM, magnetic AFM, and more. AFM scanning at an affordable price from AFMWorkshop.

There is an increasing need for state-of-the-art tools that will bring innovation to the pharmaceutical industry and help in expanding drug pipelines.

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications.

To learn, visit our website: https://www.afmworkshop.com/learning-center

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Here’s Why AFM Workshop Is Considered as the Leading Manufacturer of High-Value Atomic Force Microscopes

With over 250 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design

AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS AFM is the best option for scientists and researchers working with soft samples and biomaterials. Our newest model, the B AFM, is useful for routine scanning and educational purposes. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee

AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training

About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, And Education

AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists and engineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range - plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

To learn more about our atomic force microscopes, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

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