Labtron Atomic Force Microscope combines a scan head and sample stage for excellent anti-vibration performance. With 0.2 nm X/Y and 0.05 nm Z resolution, 360° scan angle, optical observation system, and CCD auto-focus via servomotor.
seen from Türkiye
seen from China
seen from China
seen from Argentina
seen from United States
seen from United States
seen from United States
seen from China
seen from Germany

seen from Ukraine

seen from United Kingdom
seen from Türkiye
seen from Malaysia
seen from China
seen from France
seen from China
seen from China

seen from Italy
seen from Italy
seen from China
Labtron Atomic Force Microscope combines a scan head and sample stage for excellent anti-vibration performance. With 0.2 nm X/Y and 0.05 nm Z resolution, 360° scan angle, optical observation system, and CCD auto-focus via servomotor.
Labtron Atomic Force Microscope features a combined scan head and sample stage for strong anti-vibration performance. It offers a 20 µm X/Y scan range, 4x CCD magnification, and high resolution of 0.2 nm (X/Y) and 0.05 nm (Z).
The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope. To learn, visit our website: https://www.afmworkshop.com/applications/research/atomic-force-microscope-for-life-sciences
Focus Assist for TT-2 AFM AFM Accessories The focus assist option replaces the manual optical microscope support on the TT-AFM. This option includes video optics, control electronics and control software.
The focus assist option replaces the manual optical microscope support on the TT-AFM. This option includes video optics, control electronics and control software. Feel free to call us 1 (888) 671-5539
AFM Training Programs - An Overview!
AFMWorkshop is committed to helping our customers develop the strong AFM skill sets necessary to produce world-class AFM images.
To learn more about atomic force microscopes training, feel free to visit www.afmworkshop.com
16 Micron Z Piezoelectric Ceramic/Probe Holder with Strain Gauge AFM Accessories For the LS, NP and SA-AFM. Z piezoelectric/probe holder with strain gauge. Designed for general AFM applications, and for applications requiring force distance curves.
To know more visit here : https://www.afmworkshop.com/
Global Delivery Of Atomic Force Microscopes First Class Training. To Know More Visit : https://afmworkshop.com/
To know more visit here : https://www.afmworkshop.com/